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IEEE association, which promotes the innovations and advanced technologies on behalf of mankind, is the biggest technical professional company. Its purpose is to serve the specialists who work in all branches of electrical engineering, electronics, computer technology and related fields of science and technology, which are parts of modern civilization. IEEE´s roots date back to 1884, when electricity began to influence society significantly. At that time there was one major established electrical branch, the telegraph, thanks to that in the 40s in the 19th century the world was linked through the data communication system faster than transport. Telephone industry, energy industry and light industry just began to be developed.
Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Body from Wireless Communications Devices, 30 MHz - 6 GHz Part 3: Specific Requirements for Using the Finite Difference Time Domain (FDTD) Method for SAR Calculations of Mobile Phones
Standard published on 27.10.2017
Selected format:IEC/IEEE International Standard - Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communication devices, 30 MHz to 6 GHz – Part 4: General requirements for using the finite element method for SAR calculations
Standard published on 19.10.2020
Selected format:IEEE Standard Criteria for the Design, Installation, and Qualification of Raceway Systems for Class 1E Circuits for Nuclear Power Generating Stations
Standard published on 24.2.2012
Selected format:IEEE Standard Criteria for the Design, Installation, and Qualification of Raceway Systems for Class 1E Circuits for Nuclear Power Generating Stations
Standard published on 15.4.2020
Selected format:Standard for N times 64 kilobit per second optical fiber interfaces between teleprotection and multiplexer equipment
Standard published on 22.1.2013
Selected format:IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
Standard published on 30.7.2013
Selected format:IEC/IEEE Test methods for the characterization of organic transistors and materials
Standard published on 30.7.2013
Selected format:IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
Standard published on 30.12.2015
Selected format:IEC/IEEE International standard for receiver fixture interface
Standard published on 30.12.2015
Selected format:IEEE/IEC International Standard--Format for LSI-Package-Board Interoperable design
Standard published on 19.10.2023
Selected format:Latest update: 2025-08-20 (Number of items: 2 213 083)
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