JIS - Japanese technical standards - Page 330

Standards JIS - Japanese technical standards - Page 330

JIS covers industrial and mineral products, comparable to standards established by various industrial associations for specific needs, or standards established and used by companies (operation manuals, products specifications etc.). The need for common practices in companies of the same industrial sector leads to the establishment of industrial association standards, and the same need in terms of wider applications promotes the establishment of JIS.

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JIS C5402-23-4:2006

Connectors for electronic equipment -- Tests and measurements -- Part 23-4: Screening and filtering tests -- Test 23d: Transmission line reflections in the time domain

Standard published on 25.3.2006

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JIS C5402-3-1:2005

Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance

Standard published on 20.3.2005

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JIS C5402-4-1:2005

Connectors for electronic equipment -- Tests and measurements -- Part 4-1: Voltage stress tests -- Test 4a: Voltage proof

Standard published on 20.12.2005

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JIS C5402-4-2:2005

Connectors for electronic equipment -- Tests and measurements -- Part 4-2: Voltage stress tests -- Test 4b: Partial discharge

Standard published on 20.3.2005

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JIS C5402-4-3:2005

Connectors for electronic equipment -- Tests and measurements -- Part 4-3: Voltage stress tests -- Test 4c: Voltage proof of pre-insulated crimp barrels

Standard published on 20.3.2005

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JIS C5402-5-1:2005

Connectors for electronic equipment -- Tests and measurements -- Part 5-1: Current-carrying capacity tests -- Test 5a: Temperature rise

Standard published on 20.3.2005

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JIS C5402-5-2:2005

Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating

Standard published on 20.3.2005

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JIS C5402-6-1:2005

Connectors for electronic equipment -- Tests and measurements -- Part 6-1: Dynamic stress tests -- Test 6a: Acceleration, steady state

Standard published on 20.3.2005

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JIS C5402-6-2:2005

Connectors for electronic equipment -- Tests and measurements -- Part 6-2: Dynamic stress tests -- Test 6b: Bump

Standard published on 20.3.2005

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JIS C5402-6-3:2005

Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock

Standard published on 20.3.2005

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