Warning

Your browser does not currently support JavaScript. It is possible that some feature will not work. JavaScript is required for the online shop to function fully. Here are the instructions on how to enable JavaScript in your web browser.

Standards JIS - Japanese technical standards - Page 376

JIS covers industrial and mineral products, comparable to standards established by various industrial associations for specific needs, or standards established and used by companies (operation manuals, products specifications etc.). The need for common practices in companies of the same industrial sector leads to the establishment of industrial association standards, and the same need in terms of wider applications promotes the establishment of JIS.

Price display: excl. VAT

Displayed currency: USD

Sort by:

Narrow the selection for the "JIS - Japanese technical standards - Page 376" by:

Enter the number of the standard or the text which you are looking for:

Publication year

Valid (11691)

Invalid (0)

JIS C61300-3-45:2025

Fiber optic interconnecting devices and passive components-Basic test and measurement procedures-Part 3-45: Examinations and measurements-Attenuation of random mated multi-fiber connectors

Standard published on 20.2.2025

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

JIS C61300-3-47:2016

Fiber optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-47: End face geometry of PC and Angled PC spherically polished ferrule using interferometry

Standard published on 20.12.2016

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

JIS C61300-3-50:2016

Fiber optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-50: Crosstalk for optical switches

Standard published on 22.3.2016

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

JIS C61300-3-53:2022

Fiber optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-53: Examinations and measurements -- Encircled angular flux (EAF) measurement method based on two-dimensional far field data from multimode waveguide (including fiber)

Standard published on 20.9.2022

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

JIS C61300-3-54:2020

Fiber optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-54: Examinations and measurements -- Angular misalignment between ferrule bore axis and ferrule axis for cylindrical ferrules

Standard published on 23.9.2020

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

JIS C61300-3-6:2011

Fiber optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-6: Examinations and measurements -- Return loss

Standard published on 20.1.2011

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

JIS C61300-3-7:2024

Fiber optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-7: Examinations and measurements -- Wavelength dependence of attenuation and return loss of single mode components

Standard published on 20.2.2024

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

JIS C61326-1:2022

Electrical equipment for measurement, control and laboratory use -- EMC requirements -- Part 1: General requirements

Standard published on 22.8.2022

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

JIS C61326-2-1:2022

Electrical equipment for measurement, control and laboratory use -- EMC requirements -- Part 2-1: Particular requirements -- Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications

Standard published on 22.8.2022

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

JIS C61326-2-2:2024

Electrical equipment for measurement, control and laboratory use -- EMC requirements -- Part 2-2: Particular requirements -- Test configurations, operational conditions and performance criteria for portable testing, measuring and monitoring equipment used in low-voltage distribution systems

Standard published on 20.2.2024

Selected format:

Japanese -

electronic design (pdf) (ON REQUEST)

Show all technical information.

ON REQUEST

IN STOCK

Entries shown from 3750 to 3760 out of a total of 11691 entries.