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R 50.2.017-2001

State system for ensuring the uniformity of measurements. Means of measurement of illumination and UV radiation daily dose in photobiology and crop production. Verification procedure

Standard published on 1.7.2002

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572.00 USD


in 4 working days
R 50.2.018-2001

State system for ensuring the uniformity of measurements. Measurement of ultraviolet radiation characteristics of bactericidal irradiators. Verification procedure

Standard published on 1.7.2002

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925.00 USD


in 7 working days
R 50.2.019-2001

State system for ensuring the uniformity of measurements. Water-medium sound velocimeters. Method of verification and calibration

Standard published on 1.6.2002

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133.00 USD


in 1 working days
R 50.2.021-2002

State system for ensuring the uniformity of measurements. Reference solutions of specific electrical conductivity of liquids. Methods of preparation and initial verification

Standard published on 1.7.2002

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280.00 USD


in 2 working days
R 50.2.022-2002

State System for Ensuring Uniform Measurement. Light ions aspiration counters. Verification procedure

Standard published on 1.7.2002

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176.00 USD


in 2 working days
R 50.2.023-2002

State System for Ensuring Uniform Measurement. Levels. Test procedure

Standard published on 1.12.2002

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260.00 USD


in 2 working days
R 50.2.025-2002

State System for Ensuring Uniform Measurement. Laser dosimeters. Verification method

Standard published on 1.3.2003

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364.00 USD


in 3 working days
R 50.2.026-2002

State System for Ensuring Uniform Measurement. Resistance thermal and electromagnetic flowmeters in custody heat meter units. Method of selection of thermocouples pairs and approval of flow meters for metrological characteristics. General provisions

Standard published on 1.7.2003

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218.00 USD


in 2 working days
R 50.2.027-2002

State system for ensuring the uniformity of measurements. Measurement in optoelectronics. Terms and definitions. Part II. Measuring values and parameters

Standard published on 1.7.2003

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1 565.00 USD


in 11 working days
R 50.2.029-2003

State system for ensuring the uniformity of measurements. Measurement in optoelectronics. Terms and definitions. Part III. Measuring instruments and their elements

Standard published on 1.4.2004

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1 379.00 USD


in 10 working days

Entries shown from 220 to 230 out of a total of 312 entries.


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