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Piezoelectric devices and electromechanical filters. Method of checking the electrical strength of insulation
Standard published on 1.3.2025
Selected format:Epitaxial structures. Method for measuring the thickness of epitaxial silicon layers in structures of the silicon-on-sapphire type based on IR interference
Standard published on 1.3.2025
Selected format:Constant non-wireless high frequency resistors resistors and resistive absorbers. Attenuation measurement methods
Standard published on 1.3.2025
Selected format:Piezoelectric resonators. Methods of measuring the accuracy of the setting
Standard published on 1.3.2025
Selected format:High-voltage kenotrons. Method of measuring the temperature of the cylinder
Standard published on 1.3.2025
Selected format:Electro-optical elements. Methods for measuring the tangent of dielectric loss angle
Standard published on 1.3.2025
Selected format:Dissectors. Method for determining the counting rate of signal and dark pulses
Standard published on 1.3.2025
Selected format:Condenser mica. Specifications
Standard published on 1.1.1984
Selected format:Dissectors. Dark current measurement method
Standard published on 1.3.2025
Selected format:Dissectors. Method for determining the nonlinearity of the light characteristic
Standard published on 1.3.2025
Selected format:Latest update: 2026-09-04 (Number of items: 2 300 131)
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