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Silicon is a semiconductor. Method of measuring the concentration of impurities
Standard published on 1.3.2025
Selected format:Cryoelectronic and thermoelectronic cooled products. Methods of measuring noise temperature in the range 4—100 K
Standard published on 1.3.2025
Selected format:Sign-synthesizing gas-discharge indicators. Methods of quality assessment in the control of electrical parameters
Standard published on 1.3.2025
Selected format:Electronic equipment products. Electrochemical method for determining the quality index of coatings
Standard published on 1.3.2025
Selected format:Resists for integrated circuits, semiconductor devices and photomasks. General technical requirements
Standard published on 1.3.2025
Selected format:D.c. bridges for measuring resistance
Standard published on 1.7.1995
Selected format:Electronic materials. Ceramics and parts made from it. General technical requirements
Standard published on 1.3.2025
Selected format:Mebe?? ? hemexah??eckoe obopy?obah?e cy?obx pome?eh??. Fyhk??oha??he pa?mep
Standard published on 1.12.2024
Selected format:Gophoe ?e?o. Meto? oppe?e?eh?? p?cka ?aga??pobah?? gophx bpabotok. Ob??e pp?h??p
Standard published on 1.11.2024
Selected format:Health informatics. HL7 personal health record system functional model. Release 1 (PHRS FM)
Standard published on 1.5.2020
Selected format:Latest update: 2026-09-04 (Number of items: 2 300 131)
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