Semiconductor diodes. Total series equivalent resistance measurement methods

Standard published on 1.7.1985

Semiconductor tunnel diodes. Method for measuring negative conductance of the intrinsic diode

Standard published on 1.7.1976

Semiconductor tunnel diodes. Methods for measuring peak point current, valley point current, peak point voltage, valley point voltage, projected peak point voltage

Standard published on 1.7.1976

Semiconductor diodes. Methods for measuring differential and slope resistances

Standard published on 1.7.1986

Reference diodes. Method of measuring stabilization voltage

Standard published on 1.1.1977

Rectifier diodes. Methods of measuring average forward voltage and average reverse current

Standard published on 1.1.1974

Reference diodes. Method of measuring of temperature coefficient of working voltage

Standard published on 1.7.1974

Variable capacitance diodes. Method of measuring temperature coefficient of capacitance

Standard published on 1.7.1974

Variable capacitance diodes. Method for measuring the quality factor

Standard published on 1.1.1975

Semiconductor diodes. Reference zener diodes. Method for measuring warm up time

Standard published on 1.1.1979