ASTM E1127-08(2015)

Standard Guide for Depth Profiling in Auger Electron Spectroscopy



STANDARD published on 1.6.2015


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The information about the standard:

Designation standards: ASTM E1127-08(2015)
Publication date standards: 1.6.2015
SKU: NS-591391
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

The category - similar standards:

Physicochemical methods of analysis

Annotation of standard text ASTM E1127-08(2015) :

Keywords:
angle lapping, angle-resolved AES, Auger electron spectroscopy, ball cratering, compositional depth profiling, cross sectioning, depth profiling, depth resolution, sputter depth profiling, sputtering, thin films,, ICS Number Code 71.040.50 (Physicochemical methods of analysis)

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