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Standard Guide for Depth Profiling in Auger Electron Spectroscopy
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STANDARD published on 1.10.2024
Designation standards: ASTM E1127-24
Publication date standards: 1.10.2024
SKU: NS-1202540
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
angle lapping, angle-resolved AES, Auger electron spectroscopy, ball cratering, compositional depth profiling, cross sectioning, depth profiling, depth resolution, sputter depth profiling, sputtering, thin films,
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