ASTM E1162-11(2019)

Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

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STANDARD published on 1.11.2019


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The information about the standard:

Designation standards: ASTM E1162-11(2019)
Publication date standards: 1.11.2019
SKU: NS-976103
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM

The category - similar standards:

Physicochemical methods of analysis

Annotation of standard text ASTM E1162-11(2019) :

Keywords:
ICS Number Code 71.040.50 (Physicochemical methods of analysis)

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