Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray SpectrometerTranslate name
STANDARD published on 1.6.2016
Designation standards: ASTM E1172-16
Publication date standards: 1.6.2016
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
sequential spectrometer, simultaneous spectrometer, spectrometry, X-ray fluorescence, X-ray spectrometer ,, ICS Number Code 17.180.30 (Optical measuring instruments)
|Significance and Use|
4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.
4.2 It is understood that a laboratory may implement this practice or an X-ray fluorescence method in partnership with a manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the following should be considered. The laboratory should have an idea of the alloy matrices to be analyzed, elements and mass fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should inform the instrument manufacturer of these requirements so they may develop an analytical method which meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections, calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a basic understanding of the parameters derived by the manufacturer.
1.1 This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. However, the practice does attempt to identify which tolerances are critical and thus which should be specified.
1.2 This standard does not purport to
address all of the safety concerns, if any, associated with its
use. It is the responsibility of the user of this standard to
establish appropriate safety and health practices and to determine
the applicability of regulatory limitations prior to use.
Guide for Validating Analytical
Methods Terminology Relating to Analytical
Chemistry for Metals, Ores, and Related Materials
Guide for Validating Analytical Methods
Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials
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