Standard Guide for Handling Specimens Prior to Surface AnalysisTranslate name
STANDARD published on 1.12.2020
Designation standards: ASTM E1829-14(2020)
Publication date standards: 1.12.2020
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Auger electron spectroscopy, secondary ion mass spectrometry, specimen handling, surface analysis, X-ray photoelectron spectroscopy,, ICS Number Code 71.040.50 (Physicochemical methods of analysis)
|Significance and Use|
4.1ï¿½Proper handling and preparation of specimens is particularly critical for analysis. Improper handling of specimens can result in alteration of the surface composition and unreliable data. Specimens should be handled carefully so as to avoid the introduction of spurious contaminants. The goal must be to preserve the state of the surface so that analysis remains representative of the original subject.
4.2ï¿½AES, XPS, and SIMS are sensitive to surface layers that are typically a few nanometres thick. Such thin layers can be subject to severe perturbations from improper specimen handling 4.3ï¿½This guide describes methods to minimize the effects of specimen handling on the results obtained using surface-sensitive analytical techniques. It is intended for the specimen owner or the purchaser of surface analytical services and the surface analyst. Because of the wide range of types of specimens and desired information, only broad guidelines and general examples are presented here. The optimum handling procedures will be dependent on the particular specimen and the needed information. It is recommended that the specimen supplier consult the surface analyst as soon as possible with regard to specimen history, the specific problem to be solved or information needed, and the particular specimen preparation or handling procedures required. The surface analyst also is referred to Guide that discusses additional procedures for preparing, mounting, and analysis of specimens.
1.1ï¿½This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:
1.1.1ï¿½Auger electron spectroscopy (AES),
1.1.2ï¿½X-ray photoelectron spectroscopy (XPS or ESCA), and
1.1.3ï¿½Secondary ion mass spectrometry (SIMS).
1.1.4ï¿½Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.
1.2ï¿½This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
1.3ï¿½This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
|2. Referenced Documents|
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