ASTM E1855-10

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors



STANDARD published on 1.10.2010


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The information about the standard:

Designation standards: ASTM E1855-10
Note: WITHDRAWN
Publication date standards: 1.10.2010
SKU: NS-43329
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E1855-10 :

Keywords:

displacement damage, neutron damage, radiation hardness, silicon transistors, spectrum sensors, Damage assessment--nuclear materials/applications, Displacement--electronic materials/applications, Radiation-hardness testing, Silicon bipolar transistors, Spectrum sensors, ICS Number Code 31.200 (Integrated circuits. Microelectronics)

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