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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
STANDARD published on 10.12.1996
Designation standards: ASTM E1855-96
Note: WITHDRAWN
Publication date standards: 10.12.1996
SKU: NS-43330
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
Displacement damage, Neutron damage, Radiation hardness, Silicon transistors, Spectrum sensors, ICS Number Code 31.200 (Integrated circuits. Microelectron)
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1.1 This test method covers how 2N2222A silicon bipolar transistors can be used either as dosimetry sensors in the determination of neutron energy spectra, or as silicon 1-MeV equivalent displacement damage fluence monitors. |
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