ASTM E2245-11(2018)

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

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STANDARD published on 1.5.2018

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The information about the standard:

Designation standards: ASTM E2245-11(2018)
Publication date standards: 1.5.2018
SKU: NS-848387
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: American technical standard
Category: Technical standards ASTM

The category - similar standards:

Photographic paper, films and cartridges

Annotation of standard text ASTM E2245-11(2018) :

cantilevers, combined standard uncertainty, fixed-fixed beams, interferometry, length measurements, microelectromechanical systems, MEMS, polysilicon, residual strain, round robin, stiction, strain gradient, test structure,, ICS Number Code 37.040.20 (Photographic paper, film and plates. Cartridges)

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