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ASTM E2444-05e1
Terminology Relating to Measurements Taken on Thin, Reflecting Films (Includes all amendments And changes 12/23/2011).
Automatically translated name:
Terminology Relating to Measurements Taken on Thin, Reflecting Films
STANDARD published on 1.5.2005
The information about the standard:
Designation standards: ASTM E2444-05e1
Note: WITHDRAWN
Publication date standards: 1.5.2005
SKU: NS-45310
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM E2444-05e1 :
Keywords:
ICS Number Code 01.040.31 (Electronics (Vocabularies)), 31.240 (Mechanical structures for electronic equipment)
Additional information
| 1. Scope | ||||||||
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1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard. 1.2 The terms are listed in alphabetical order. |
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| 2. Referenced Documents | ||||||||
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