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ASTM E2444-11
Terminology Relating to Measurements Taken on Thin, Reflecting Films
STANDARD published on 15.10.2011
The information about the standard:
Designation standards: ASTM E2444-11
Note: WITHDRAWN
Publication date standards: 15.10.2011
SKU: NS-45311
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM E2444-11 :
Keywords:
ICS Number Code 01.040.31 (Electronics (Vocabularies)), 31.240 (Mechanical structures for electronic equipment)
Additional information
| 1. Scope | ||||||||
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1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard. 1.2 The terms are listed in alphabetical order. |
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| 2. Referenced Documents | ||||||||
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