ASTM E2444-11(2018)

Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films

Translate name

STANDARD published on 1.5.2018


Language
Format
AvailabilityIN STOCK
Price55.00 USD excl. VAT
55.00 USD

The information about the standard:

Designation standards: ASTM E2444-11(2018)
Publication date standards: 1.5.2018
SKU: NS-848389
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM E2444-11(2018) :

Keywords:
cantilevers, definitions, fixed-fixed beams, interferometry, length measurements, microelectromechanical systems, MEMS, polysilicon, residual strain, stiction, strain gradient, terminology, test structure,, ICS Number Code 01.040.31 (Electronics (Vocabularies)), 31.240 (Mechanical structures for electronic equipment)



Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.