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ASTM E431-96
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
STANDARD published on 10.12.1996
The information about the standard:
Designation standards: ASTM E431-96
Note: WITHDRAWN
Publication date standards: 10.12.1996
SKU: NS-46761
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM E431-96 :
Keywords:
electronic devices, nondestructive testing, radiographs, radiography, reference illustrations, semiconductors, x-ray
Additional information
| 1. Scope | ||||||||
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1.1 This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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| 2. Referenced Documents | ||||||||
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