ASTM E431-96(2011)

Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices



STANDARD published on 1.12.2011


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The information about the standard:

Designation standards: ASTM E431-96(2011)
Note: WITHDRAWN
Publication date standards: 1.12.2011
SKU: NS-46760
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

The category - similar standards:

Semiconductor devices in general

Annotation of standard text ASTM E431-96(2011) :

Keywords:
electronic devices, nondestructive testing, radiographs, radiography, reference illustrations, semiconductors, x-ray, ICS Number Code 31.080.01 (Semi-conductor devices in general)

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