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Standard Terminology Relating to Surface Analysis
STANDARD published on 10.11.2001
Designation standards: ASTM E673-01
Note: WITHDRAWN
Publication date standards: 10.11.2001
SKU: NS-47606
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
terminology, ICS Number Code 01.040.17 (Metrology and measurement. Physical phenomena (Vocabularies)), 17.040.20 (Properties of surfaces)
1. Scope |
1.1 This terminology is related to the various disciplines involved in surface analysis. 1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA). |
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