We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Standard Terminology Relating to Surface Analysis
STANDARD published on 10.7.2002
Designation standards: ASTM E673-02
Note: WITHDRAWN
Publication date standards: 10.7.2002
SKU: NS-47607
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
terminology, ICS Number Code 01.040.17 (Metrology and measurement. Physical phenomena (Vocabularies)),17.040.20 (Properties of surfaces)
1. Scope |
1.1 This terminology is related to the various disciplines involved in surface analysis. 1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA). |
Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.
Latest update: 2024-05-17 (Number of items: 2 902 148)
© Copyright 2024 NORMSERVIS s.r.o.