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Standard Terminology Relating to Surface Analysis (Includes all amendments And changes 8/16/2017).
Automatically translated name:
Standard Terminology Relating to Surface Analysis
STANDARD published on 10.12.2002
Designation standards: ASTM E673-02a
Note: WITHDRAWN
Publication date standards: 10.12.2002
SKU: NS-47608
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
terminology, surface analysis
1. Scope |
1.1 This terminology is related to the various disciplines involved in surface analysis. 1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA). |
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