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ASTM E995-97
Standard Guide for Background Subtraction Techniques in Auger Electron and X-ray Photoelectron Spectroscopy
STANDARD published on 10.2.1997
The information about the standard:
Designation standards: ASTM E995-97
Note: WITHDRAWN
Publication date standards: 10.2.1997
SKU: NS-48727
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM E995-97 :
Keywords:
Auger electron spectroscopy, surface analysis, X-ray photoelectron spectroscopy, background subtraction, ICS Number Code 17.180.30 (Optical measuring instruments)
Additional information
| 1. Scope | ||||
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1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation. 1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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| 2. Referenced Documents | ||||
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