ASTM F1048-87(1999)

Standard Test Method for Measuring the Effective Surface Roughness of Optical Components by Total Integrated Scattering (Withdrawn 2003)



STANDARD published on 1.1.1999


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The information about the standard:

Designation standards: ASTM F1048-87(1999)
Note: WITHDRAWN
Publication date standards: 1.1.1999
SKU: NS-48934
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1048-87(1999) :

Keywords:

Dielectrics, Diffuse reflectance, Effective surface roughness, Flat optical surfaces, Helium-neon laser, Integrated light scattering, Lasers and laser applications, Light-scattering, Metal mirrors, Microroughness, Mirrors, Monitoring-semiconductor processing, Nondestructive evaluation (NDE)-semiconductors, Radiation exposure-electronic components/devices, Reflectance and reflectivity-electronic materials/applications, Roughness, Scattering parameters, Solar collectors, Solar spectral irradiance



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