We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Test Method for Resistivity of Silicon Epitaxial Layers by the Three-Probe Voltage Breakdown Method (Includes all amendments And changes 8/13/2021).
Translate name
STANDARD published on 1.1.1988
Designation standards: ASTM F108-88e1
Note: WITHDRAWN
Publication date standards: 1.1.1988
SKU: NS-1032891
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: American technical standard
Category: Technical standards ASTM
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2025-12-26 (Number of items: 2 253 153)
© Copyright 2025 NORMSERVIS s.r.o.