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Standard ASTM F1192-24 1.5.2024 preview

ASTM F1192-24

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

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STANDARD published on 1.5.2024


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The information about the standard:

Designation standards: ASTM F1192-24
Publication date standards: 1.5.2024
SKU: NS-1187034
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: American technical standard
Category: Technical standards ASTM

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The category - similar standards:

Semiconductor devices in general

Annotation of standard text ASTM F1192-24 :

Keywords:

SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, single event, single event effect, single event phenomena, single event upset, space environment,, ICS Number Code 31.080.01 (Semi-conductor devices in general)

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