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ASTM F1262M-95
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
STANDARD published on 10.11.1995
The information about the standard:
Designation standards: ASTM F1262M-95
Note: WITHDRAWN
Publication date standards: 10.11.1995
SKU: NS-49672
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM F1262M-95 :
Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold
Additional information
| 1. Scope | ||||||||||
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1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (Si)/s. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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| 2. Referenced Documents | ||||||||||
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