ASTM F1262M-95

Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits

STANDARD published on 10.11.1995

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The information about the standard:

Designation standards: ASTM F1262M-95
Note: WITHDRAWN
Publication date standards: 10.11.1995
SKU: NS-49672
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM

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Annotation of standard text ASTM F1262M-95 :

Keywords:

digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold

Additional information

1. Scope

1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (Si)/s.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

2. Referenced Documents

Method?1021 in MIL-STD-883.	Dose Rate Threshold for Upset of Digital Microcircuits.
F1893-18	Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)
E668-20	Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
E666-21	Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
Method?1019 in MIL-STD-883.	Steady-State Total Dose Irradiation Procedure

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