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ASTM F1262M-95(2008)
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
STANDARD published on 15.6.2008
The information about the standard:
Designation standards: ASTM F1262M-95(2008)
Note: WITHDRAWN
Publication date standards: 15.6.2008
SKU: NS-49671
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM F1262M-95(2008) :
Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold, Combinational logic, Destructive testing--semiconductors, Digital integrated circuits, Electrical conductors (semiconductors), Failure end point--electronic components/devices, 0Functional errors, Integrated circuits, Ionizing radiation, Irradiance/irradiation--semiconductors, 0Microelectronic devices, MSI integrated circuits, Output transient voltage
Additional information
| Significance and Use | ||||||||||
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Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation. |
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| 1. Scope | ||||||||||
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1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (Si)/s. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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| 2. Referenced Documents | ||||||||||
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