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Method of Test for Thickness of Epitaxial Layers of Silicon by Measurement of Stacking Fault Dimension (Withdrawn 1985)
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Designation standards: ASTM F143-73(1978)
Note: WITHDRAWN
SKU: NS-50262
Approximate weight : 300 g (0.66 lbs)
Country: American technical standard
Category: Technical standards ASTM
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Latest update: 2024-05-17 (Number of items: 2 902 148)
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