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Standard Guide for Use of an X-Ray Tester (?10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
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STANDARD published on 1.6.2025
Designation standards: ASTM F1467-25
Publication date standards: 1.6.2025
SKU: NS-1223065
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
ionizing radiation effects, microcircuits, radiation hardness, semiconductor devices, X-ray testing,, ICS Number Code 31.020 (Electronic components in general)
Latest update: 2025-07-07 (Number of items: 2 207 474)
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