ASTM F1621-96

Standard Practice for Determining the Positional Accuracy Capabilities of a Scanning Surface Inspection System (Withdrawn 2003)



STANDARD published on 1.1.1996


Language
Format
AvailabilityIN STOCK
Price75.00 USD excl. VAT
75.00 USD

The information about the standard:

Designation standards: ASTM F1621-96
Note: WITHDRAWN
Publication date standards: 1.1.1996
SKU: NS-50943
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: American technical standard
Category: Technical standards ASTM

Annotation of standard text ASTM F1621-96 :

Keywords:
Localized light scattering, Particle analysis, Particle counting, Positional accuracy, Scanning surface inspection system (SSIS), SSIS (scanning surface inspection system), positional accuracy capabilities-scanning surface inspection system, (SSIS), practice,, Silicon semiconductors-slices/wafers, positional accuracy capabilities,emscanning surface inspection system, (SSIS), practice,,Order Form, ICS Number Code 29.045 (Semiconducting materials)

We recommend:

Updating of laws

Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.