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Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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STANDARD published on 1.6.2026
Designation standards: ASTM F1892-26
Publication date standards: 1.6.2026
SKU: NS-1276033
The number of pages: 42
Approximate weight : 126 g (0.28 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
ASIC (application specific integrated circuit), bipolar, cobalt 60 testing, ELDRS (enhanced low dose rate sensitivity), gamma ray tests, ionizing radiation testing, MOS, radiation hardness, semiconductor devices, time dependent effects, total dose testing, X-ray testing,, ICS Number Code 31.080.01 (Semi-conductor devices in general)
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Latest update: 2026-07-22 (Number of items: 2 289 139)
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