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  4. Standard "ASTM F416-94"
WITHDRAWN ASTM F416-94 1.1.1900 preview

ASTM F416-94

Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)




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The information about the standard:

Designation standards: ASTM F416-94
Note: WITHDRAWN
SKU: NS-55222
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM

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Annotation of standard text ASTM F416-94 :

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ICS Number Code 29.045 (Semiconducting materials)

Latest update: 2025-11-16 (Number of items: 2 243 995)
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