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ASTM F616M-96(2003)
Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric) (Withdrawn 2009)
STANDARD published on 10.6.1996
The information about the standard:
Designation standards: ASTM F616M-96(2003)
Note: WITHDRAWN
Publication date standards: 10.6.1996
SKU: NS-55913
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM F616M-96(2003) :
Keywords:
drain leakage current, leakage current, MOSFET
Additional information
| 1. Scope | ||
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1.1 This test method covers the measurement of MOSFET (Note 1) drain leakage current. Note 1-MOS is an acronym for metal-oxide semiconductor; FET is an acronym for field-effect transistor. 1.2 This test method is applicable to all enhancement-mode and depletion-mode MOSFETs. This test method specifies positive voltage and current, conventions specifically applicable to n-channel MOSFETs. The substitution of negative voltage and negative current makes the method directly applicable to p-channel MOSFETs. 1.3 The d-c test method is applicable for the range of drain voltages greater than 0 V but less than the drain breakdown voltage. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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| 2. Referenced Documents | ||
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