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ASTM F676-97
Standard Test Method for Measuring Unsaturated TTL Sink Current
STANDARD published on 1.1.1993
The information about the standard:
Designation standards: ASTM F676-97
Note: WITHDRAWN
Publication date standards: 1.1.1993
SKU: NS-56075
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM F676-97 :
Keywords:
hardness assurance, neutron degradation, sink current, transistor-transistor logic (TTL), ICS Number Code 31.080.30 (Transistors)
Additional information
| 1. Scope | ||
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1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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| 2. Referenced Documents | ||
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