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ASTM F769-00
Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)
STANDARD published on 10.6.2000
The information about the standard:
Designation standards: ASTM F769-00
Note: WITHDRAWN
Publication date standards: 10.6.2000
SKU: NS-56389
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Category: Technical standards ASTM
Annotation of standard text ASTM F769-00 :
Keywords:
diode, junction leakage, leakage current, radiation testing, total radiation dose, transistor, ICS Number Code 31.080.10 (Diodes), 31.080.30 (Transistors)
Additional information
| 1. Scope |
|
1.1 This test method covers the measurement of leakage currents of transistors and diodes. Electronic devices exposed to ionizing radiation may show increases in leakage current as the accumlated total dose rises. 1.2 These procedures are intended for the measurement of currents in the range from 10 -11 to 10 -3 A. 1.3 This test method may be used with either a virtual-ground current meter or a resistance-shunt current meter. 1.4 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this test method. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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