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Test Method for Crystallographic Perfection of Epitaxial Deposits of Silicon by Etching Techniques (Withdrawn 1998)
Designation standards: ASTM F80-94
Note: WITHDRAWN
SKU: NS-56484
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
ICS Number Code 29.045 (Semiconducting materials)
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