We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Test Method for Crystallographic Perfection of Epitaxial Deposits of Silicon by Etching Techniques (Withdrawn 1998)
Designation standards: ASTM F80-94
Note: WITHDRAWN
SKU: NS-56484
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
ICS Number Code 29.045 (Semiconducting materials)
Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.
Latest update: 2025-07-03 (Number of items: 2 207 355)
© Copyright 2025 NORMSERVIS s.r.o.