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Standard BS EN 60749-38:2008 30.6.2008 preview

BS EN 60749-38:2008

Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory.



STANDARD published on 30.6.2008


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Price214.90 USD excl. VAT
214.90 USD

The information about the standard:

Designation standards: BS EN 60749-38:2008
Publication date standards: 30.6.2008
SKU: NS-95961
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Category: Technical standards BS

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Semiconductor devices in generalHigh voltage switchgear and controlgear

Annotation of standard text BS EN 60749-38:2008 :

ISBN: 978 0 580 54875 8 Status: Definitive

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