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Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics under bending deformation for flexible electromechanical devices.
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STANDARD published on 20.4.2021
Designation standards: BS IEC 62047-35:2019
Publication date standards: 20.4.2021
SKU: NS-1023048
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS
ISBN: 978 0 580 99495 1 Status: Definitive
Latest update: 2026-10-29 (Number of items: 2 208 109)
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