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Semiconductor devices. Micro-electromechanical devices. Environmental and dielectric withstand test methods for MEMS piezoelectric thin films.
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STANDARD published on 24.4.2019
Designation standards: BS IEC 62047-36:2019
Publication date standards: 24.4.2019
SKU: NS-946980
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: British technical standard
Category: Technical standards BS
Piezoelectric and dielectric devicesOther semiconductor devices
ISBN: 978 0 580 99118 9 Status: Definitive
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Latest update: 2026-10-29 (Number of items: 2 208 109)
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