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Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM.
Automatically translated name:
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505$uT$uM
STANDARD published on 31.1.2016
Designation standards: BS IEC 63003:2015
Publication date standards: 31.1.2016
SKU: NS-625347
The number of pages: 174
Approximate weight : 553 g (1.22 lbs)
Country: British technical standard
Category: Technical standards BS
ISBN: 978 0 580 91106 4 Status: Definitive
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Latest update: 2026-11-04 (Number of items: 2 209 068)
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