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  4. Standard "BS IEC 63068-3:2020"
Standard BS IEC 63068-3:2020 24.7.2020 preview

BS IEC 63068-3:2020

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Test method for defects using photoluminescence.

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STANDARD published on 24.7.2020


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The information about the standard:

Designation standards: BS IEC 63068-3:2020
Publication date standards: 24.7.2020
SKU: NS-999494
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: British technical standard
Category: Technical standards BS

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Other semiconductor devicesSemiconductor devices in general

Annotation of standard text BS IEC 63068-3:2020 :

ISBN: 978 0 539 02136 3 Status: Definitive

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