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  4. Standard "BS IEC 63068-5:2026"
Standard BS IEC 63068-5:2026 13.10.2026 preview

BS IEC 63068-5:2026

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Test method for defects using X-ray topography.

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STANDARD published on 13.10.2026


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352.60 USD

The information about the standard:

Designation standards: BS IEC 63068-5:2026
Publication date standards: 13.10.2026
SKU: NS-1288527
The number of pages: 36
Approximate weight : 108 g (0.24 lbs)
Country: British technical standard
Category: Technical standards BS

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Other semiconductor devicesSemiconductor devices in general

Annotation of standard text BS IEC 63068-5:2026 :

ISBN: 978 0 539 32631 4 Status: Definitive

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