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Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate.
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STANDARD published on 31.8.2023
Designation standards: BS IEC 63229:2021
Publication date standards: 31.8.2023
SKU: NS-1152585
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS
Semiconductor devices in generalSemiconductor devicesOther semiconductor devices
ISBN: 978 0 539 02920 8 Status: Definitive
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