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  4. Standard "BS ISO 12406:2010"
Standard BS ISO 12406:2010 30.11.2010 preview

BS ISO 12406:2010

Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon.



STANDARD published on 30.11.2010


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302.60 USD

The information about the standard:

Designation standards: BS ISO 12406:2010
Publication date standards: 30.11.2010
SKU: NS-109799
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS

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The category - similar standards:

Chemical analysis

Annotation of standard text BS ISO 12406:2010 :

ISBN: 978 0 580 66874 6 Status: Confirmed

Latest update: 2026-08-09 (Number of items: 2 292 444)
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