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Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials.
STANDARD published on 31.8.2010
Designation standards: BS ISO 14237:2010
Publication date standards: 31.8.2010
SKU: NS-110432
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: British technical standard
Category: Technical standards BS
ISBN: 978 0 580 57402 3 Status: Confirmed
Latest update: 2026-07-09 (Number of items: 2 286 317)
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