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  4. Standard "BS ISO 14701:2011"
WITHDRAWN BS ISO 14701:2011 31.8.2011 preview

BS ISO 14701:2011

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness.



STANDARD published on 31.8.2011


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Price303.40 USD excl. VAT
303.40 USD

The information about the standard:

Designation standards: BS ISO 14701:2011
Note: WITHDRAWN
Publication date standards: 31.8.2011
SKU: NS-110647
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: British technical standard
Category: Technical standards BS

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