WITHDRAWN BS ISO 16413:2013 31.3.2013 preview

BS ISO 16413:2013

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting.



STANDARD published on 31.3.2013


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AvailabilityIN STOCK
Price356.90 USD excl. VAT
356.90 USD

The information about the standard:

Designation standards: BS ISO 16413:2013
Note: WITHDRAWN
Publication date standards: 31.3.2013
SKU: NS-111357
The number of pages: 42
Approximate weight : 126 g (0.28 lbs)
Country: British technical standard
Category: Technical standards BS



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