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Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting.
Translate name
STANDARD published on 18.8.2020
Designation standards: BS ISO 16413:2020
Publication date standards: 18.8.2020
SKU: NS-1002512
The number of pages: 42
Approximate weight : 126 g (0.28 lbs)
Country: British technical standard
Category: Technical standards BS
ISBN: 978 0 539 01652 9 Status: Definitive
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Latest update: 2026-08-07 (Number of items: 2 292 304)
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