Standard BS ISO 16413:2020 18.8.2020 preview

BS ISO 16413:2020

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting.

Translate name

STANDARD published on 18.8.2020


Language
Format
AvailabilityIN STOCK
Price354.70 USD excl. VAT
354.70 USD

The information about the standard:

Designation standards: BS ISO 16413:2020
Publication date standards: 18.8.2020
SKU: NS-1002512
The number of pages: 42
Approximate weight : 126 g (0.28 lbs)
Country: British technical standard
Category: Technical standards BS

The category - similar standards:

Chemical analysisIT applications in science

Annotation of standard text BS ISO 16413:2020 :

ISBN: 978 0 539 01652 9 Status: Definitive

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.